Resumen
Nowadays, the Internet of Things (IoT) and edge computing paradigms drive innovation in several fields, including autonomous systems, environmental monitoring, smart farming, and surveillance. The wide adoption of IoT and edge computing through commercial-off-the-shelf (COTS) provides adequate computational resources under limited energy consumption and affordable prices, which allow the development of versatile, scalable, and adaptable systems for several domains. Both features (versatility and scalability) have brought attention to domains with strict dependability requirements. However, ensuring effective, reliable, fault-tolerant IoT systems is challenging and mostly neglected in some domains. This special session briefly overviews strategies for the reliable design of IoT and edge computing systems for environmental monitoring in smart farming and urban scenarios. Then, we analyze an emerging paradigm (Split computing) and its reliability features. Furthermore, the session discusses and focuses on design challenges, learned lessons, reliability implications, and open questions.
| Idioma original | Inglés |
|---|---|
| Título de la publicación alojada | 2025 IEEE 26th Latin American Test Symposium, LATS 2025 |
| Editorial | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (versión digital) | 9781665477635 |
| DOI | |
| Estado | Publicada - 2025 |
| Evento | 26th IEEE Latin American Test Symposium, LATS 2025 - San Andres Islas, Colombia Duración: 11 mar 2025 → 14 mar 2025 |
Serie de la publicación
| Nombre | 2025 IEEE 26th Latin American Test Symposium, LATS 2025 |
|---|
Conferencia
| Conferencia | 26th IEEE Latin American Test Symposium, LATS 2025 |
|---|---|
| País/Territorio | Colombia |
| Ciudad | San Andres Islas |
| Período | 11/03/25 → 14/03/25 |
ODS de las Naciones Unidas
Este resultado contribuye a los siguientes Objetivos de Desarrollo Sostenible
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ODS 7: Energía asequible y no contaminante
Huella
Profundice en los temas de investigación de 'IoT and Edge Computing: Applications and Reliability Implications'. En conjunto forman una huella única.Citar esto
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