Equipments Details
Description
Model: XE7. Equipmet to analyze a variety of materials, reaching micro and nanoscale, with high resolution in z, properties like roughness and stiffness can be obtained.
Services
Análisis de muestras planas a escala nanométrica, medición de perfiles de alturas, rugosidad y rigidez.
Details
| Name | Atomic Force Microscope (AFM). Model: XE7 |
|---|---|
| Acquisition date | 23/10/18 |
| Decommission date | 15/10/48 |
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